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Brian Flynn (18 records)

This page contains all the U.S. trademarks filed by Brian Flynn. The list below is generated based on trademark correspondent identification information provided to the United States Patent Office (USPTO). Trademarkia.com is a free search engine of publicly available government records. Trademarkia.com does not represent correspondent listed on this page.

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Goods and Services: Computer software for controlling the metrology measuring device modules that are attached to...
DEAD (Circa: 2007)

LYNXWARE

Goods and Services: Apparatus for handling semi-conductor wafers designed to support multiple metrology measuring...
DEAD (Circa: 2007)

NANOLYNX

Goods and Services: Metrology products for optimizing manufacturing processes through the science of measurement
DEAD (Circa: 2006)

PREDICTIVE METRICS

Goods and Services: software expert system for the automatic analysis of optical data, e;g;, reflectometry, ellip...
DEAD (Circa: 2004)

N,K EXPERT

Goods and Services: Laser scanners and reflectometers for industrial inspection, namely metrology modules employi...
DEAD (Circa: 2002)

NANOCLP

Goods and Services: combination of optical metrology instruments for measuring such things as microscopic dimensi...
DEAD (Circa: 2002)

OCDSE

Goods and Services: Metrology system for the detection and measurement of particles and defects comprised princip...
DEAD (Circa: 2002)

NANOUDI

Goods and Services: Metrology instrument utilizing an optical technique for measuring microscopic features on sam...
DEAD (Circa: 2001)

NANOCD

Goods and Services: Metrology instrument, namely, apparatus for measuring thickness and/or optical properties of ...
DEAD (Circa: 2001)

TNK

Goods and Services: Electro-optical automatic fine line width metrology apparatus for measuring physical dimensio...
DEAD (Circa: 2001)

NANOLINE

Goods and Services: Metrology and inspection systems for integration into semiconductor wafer, magnetic read-writ...
DEAD (Circa: 1999)

INTOOL

Goods and Services: A metrology tool for measuring the thickness, and analyzing the composition of certain films ...
DEAD (Circa: 1998)

MIGHTYSPEC

Goods and Services: scientific measuring instrument used to measure critical dimensions, lithography overlay regi...
DEAD (Circa: 1998)

METRASPEC

Goods and Services: metrology system for the analysis and determination of properties such as thickness and optic...
DEAD (Circa: 1998)

EPIC

Goods and Services: Scientific instrument for metrology applications, namely, a metrology unit which is used to m...
DEAD (Circa: 1998)

NANOMETRA

Goods and Services: ZIRCONIATED ELECTRON EMITTER GUN ELECTRON SOURCE
DEAD (Circa: 1985)

ZEE

Goods and Services: Electro-Optical Automatic Fine Line Width Measure Apparatus
DEAD (Circa: 1980)

NANOLINE

Goods and Services: Electro-Optical Instruments for Measuring Microscopic Objects
DEAD (Circa: 1980)

NANOMETRICS

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