METRASPEC Trademark Information

Nanometrics Incorporated

scientific measuring instrument used to measure critical dimensions, lithography overlay registration, film thickness, and analysis of film composition during microelectronics manufacturing such as the production of integrated circuits

This is a brand page for the METRASPEC trademark by Nanometrics Incorporated  in Sunnyvale, , 94086.

Write a review about a product or service associated with this METRASPEC trademark. Or, contact the owner Nanometrics Incorporated of the METRASPEC trademark by filing a request to communicate with the Legal Correspondent for licensing, use, and/or questions related to the METRASPEC trademark.

On Tuesday, August 25, 1998, a U.S. federal trademark registration was filed for METRASPEC by Nanometrics Incorporated, Sunnyvale 94086. The USPTO has given the METRASPEC trademark serial number of 75542214. The current federal status of this trademark filing is ABANDONED - NO STATEMENT OF USE FILED. The correspondent listed for METRASPEC is BRIAN FLYNN of NANOMETRICS INC, 310 DEGUIGNE DR, SUNNYVALE CA 94086-3906 . The METRASPEC trademark is filed in the category of Computer & Software Products & Electrical & Scientific Products . The description provided to the USPTO for METRASPEC is scientific measuring instrument used to measure critical dimensions, lithography overlay registration, film thickness, and analysis of film composition during microelectronics manufacturing such as the production of integrated circuits.

Word mark: METRASPEC
Status/Status Date:
ABANDONED - NO STATEMENT OF USE FILED
5/24/2000
Serial Number: 75542214
Filing Date: 8/25/1998
Registration Number: NOT AVAILABLE
Registration Date: NOT AVAILABLE
Goods and Services: scientific measuring instrument used to measure critical dimensions, lithography overlay registration, film thickness, and analysis of film composition during microelectronics manufacturing such as the production of integrated circuits
Mark Description: NOT AVAILABLE
Type Of Mark: TradeMark
Published For Opposition Date: 8/31/1999
Last Applicant/Owner: Nanometrics Incorporated
Sunnyvale 94086
Mark Drawing Code: Typeset (Words/letter/Number)
Design Search: (NO DATA)
Register Type: Principal
Disclaimer: (NOT AVAILABLE)
Correspondent:
NANOMETRICS INC
310 DEGUIGNE DR
SUNNYVALE CA 94086-3906

Intent to Use Trademark - Applicant has not submitted proof of use in commerce the the USPTO.

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Current Trademark Status:
5/24/2000
ABANDONED - NO STATEMENT OF USE FILED
Correspondent Search:

BRIAN FLYNN is a correspondent of METRASPEC trademark.

Current Overall Rating:
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