NANOCLP Trademark Information

Nanometrics Incorporated

Laser scanners and reflectometers for industrial inspection, namely metrology modules employing optical measuring techniques, particularly reflectometry and laser profiling to non-destructively monitor the surface profiles of samples of semiconductor wafers, flat panel displays and magnetic media

This is a brand page for the NANOCLP trademark by Nanometrics Incorporated  in Milpitas, , 95035.

Write a review about a product or service associated with this NANOCLP trademark. Or, contact the owner Nanometrics Incorporated of the NANOCLP trademark by filing a request to communicate with the Legal Correspondent for licensing, use, and/or questions related to the NANOCLP trademark.

On Friday, November 8, 2002, a U.S. federal trademark registration was filed for NANOCLP by Nanometrics Incorporated, Milpitas 95035. The USPTO has given the NANOCLP trademark serial number of 76466035. The current federal status of this trademark filing is ABANDONED - NO STATEMENT OF USE FILED. The correspondent listed for NANOCLP is BRIAN FLYNN of NANOMETRICS INC., 1550 BUCKEYE DRIVE, MILPITAS, CALIFORNIA 95035 . The NANOCLP trademark is filed in the category of Computer & Software Products & Electrical & Scientific Products . The description provided to the USPTO for NANOCLP is Laser scanners and reflectometers for industrial inspection, namely metrology modules employing optical measuring techniques, particularly reflectometry and laser profiling to non-destructively monitor the surface profiles of samples of semiconductor wafers, flat panel displays and magnetic media.

Word mark: NANOCLP
Status/Status Date:
ABANDONED - NO STATEMENT OF USE FILED
3/10/2004
Serial Number: 76466035
Filing Date: 11/8/2002
Registration Number: NOT AVAILABLE
Registration Date: NOT AVAILABLE
Goods and Services: Laser scanners and reflectometers for industrial inspection, namely metrology modules employing optical measuring techniques, particularly reflectometry and laser profiling to non-destructively monitor the surface profiles of samples of semiconductor wafers, flat panel displays and magnetic media
Mark Description: NOT AVAILABLE
Type Of Mark: TradeMark
Published For Opposition Date: 6/17/2003
Last Applicant/Owner: Nanometrics Incorporated
Milpitas 95035
Mark Drawing Code: Typeset (Words/letter/Number)
Design Search: (NO DATA)
Register Type: Principal
Disclaimer: (NOT AVAILABLE)
Correspondent:
NANOMETRICS INC.
1550 BUCKEYE DRIVE
MILPITAS, CALIFORNIA 95035

Intent to Use Trademark - Applicant has not submitted proof of use in commerce the the USPTO.

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Current Trademark Status:
3/10/2004
ABANDONED - NO STATEMENT OF USE FILED
Correspondent Search:

BRIAN FLYNN is a correspondent of NANOCLP trademark.

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