express
on 25 Mar 2022
Last Applicant/ Owned by
16 Jonspin Road
Wilmington
MA
01887
Serial Number
97308063 filed on 11th Mar 2022
Registration Number
N/A
Correspondent Address
HEATHER J. KLIEBENSTEIN
Filing Basis
1. intent to use
2. intent to use current
Disclaimer
NO DATA
The mark consists of the words "ONTO INNOVATION" in red, lower case letters. The word "ONTO" is in bold, stylized letters with the word "INNOVATION" above the second "O" in the word "ONTO". Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for Read More
Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials; Metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; Metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; Metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; Optical inspection equipment for 2D and 3D inspection of semiconductor materials; Metrology instruments metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology
Software for the semiconductor industry, namely, software for identifying defects in semiconductor structures, software for identifying semiconductor fabrication process excursions, software for recording and reviewing defects in semiconductors structures, software for identifying root causes of defects in semiconductor structures, and software for controlling and monitoring semiconductor fabrication equipment
No 97308063
No Service Mark
No 15067197US02
No
No
No
No
No
No
No
No
The mark consists of the words "ONTO INNOVATION" in red, lower case letters. The word "ONTO" is in bold, stylized letters with the word "INNOVATION" above the second "O" in the word "ONTO".
Status Date | Action Taken |
---|---|
25th Mar 2022 | ABANDONMENT NOTICE E-MAILED - EXPRESS ABANDONMENT |
25th Mar 2022 | ABANDONMENT - EXPRESS MAILED |
24th Mar 2022 | TEAS EXPRESS ABANDONMENT RECEIVED |
16th Mar 2022 | NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM |
15th Mar 2022 | NEW APPLICATION ENTERED IN TRAM |