on 16 Jun 2020
Last Applicant/ Owned by
F-25000 BESANCON
FR
Serial Number
79263628 filed on 11th Apr 2019
Registration Number
6077160 registered on 16th Jun 2020
Filing Basis
No Filing Basis
Disclaimer
NO DATA
The mark consists of a stylized design featuring a compass in the bottom left corner, the reversed symbol for surface texture in the middle, and a sloping caliper on the right. Precision measuring apparatus, namely, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle, image, form, topography, roundness, cylindricity, roughness, waviness, thickness, Read More
Precision measuring apparatus, namely, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle, image, form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral, multi-spectral, and fourier analysis measuring devices; Electric measuring apparatus, namely, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle, image, form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral, multi-spectral, and fourier analysis measuring devices; Measuring apparatus and instruments, namely, scale sensitive fractal, contour, texture, force curve analysis, colocalization, free form surface, particle, image, form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral, multi-spectral, and fourier analysis measuring devices; Computer systems comprised of computer hardware; recorded software for the analysis and processing of images, in particular microscopy images including scanning electron microscopy images, scanning probe microscopy images, hyperspectral microscopy images, images generated by tomography including x-ray computed tomography, The analysis of form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data and fourier analysis; Recorded software for desk top publishing and reporting especially by workflow presentation, of scientific, technical, statistical data; Recorded software for statistical analysis of scientific and microscopy data; Optical frequency metrology devices; micrometers; Recorded USB software drivers; Interfaces for detectors; Recorded software for conversion of document images into electronic format; transmitters of electronic signals; Recorded computer software for data processing; Apparatus for recording, transmission or reproduction of information; Tape measures; Measuring instruments, namely, protractors; electric regulating apparatus; Technical measuring, testing and checking apparatus and instruments for measuring, testing and checking the temperature, pressure, quantity and concentration of gas and liquids; Testing apparatus not for medical use, namely, testing devices for testing printed circuit boards; Downloadable software for remote monitoring and analysis; Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signaling, checking, life-saving and teaching apparatus and instruments, namely, optical profilometers, interferometers, optical microscopes, confocal microscopes, scanning electron microscopes, transmission electronic microscopes, scanning probe microscopes, atomic force microscopes, spectrometers, raman spectroscopes, and tomographs including x-ray tomographs; Apparatus for recording, transmission, reception, processing or reproduction of sounds, images or data; Microscopes; Microscopy diffraction apparatus; Cards encoded with security features for identification purposes; optical sensors; measuring sensors other than for medical use, namely, x-ray detectors, contact and non-contact distance measuring sensors, electron and photon detectors in particular for microscopy and profilometry, cathodoluminescence detectors, four-quadrant electronic detectors, laser-based distance and form measuring sensors; Electric and electronic control apparatus and instruments, namely, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle, image, form, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral, and multi-spectral measuring devices}; Recorded software for monitoring computer hardware functions; Apparatus and instruments for scanning probe microscopy, namely, microscopes; Apparatus and instruments for microscopy, namely, microscopes; Electronic imaging devices the field of iridology, sclerology, rayid and eyology not for medical use; Data processing apparatus; Optical readers; Recorded data processing software; Blank recordable optical data media; Scanners; Simultaneous interpretation receivers; Computer user manuals in electronic format recorded on electronic media; Optical inspection apparatus and instruments; Computers; Recorded software for the analysis of measurement data, in particular from metrology or relief mapping apparatus; Recorded image analysis software, in particular from all types of microscopes; Recorded software for characterizing or measuring grains and particles; Recorded software for the analysis of surface conditions, in particular roughness and waviness; Recorded software for the analysis of surveying, in particular for atomic-force microscopes, electron microscopes, optical and contact profilometers, cameras, systems used by surveyors, and systems used by geographers; Recorded software for analyzing dimensions; Recorded software for analyzing the form, in particular errors in form in connection with a model; Recorded software for analyzing straightness, flatness, thickness, circularity, cylindricity, angles, distance and contours; Recorded spectral analysis software, in particular multi-spectral and hyper-spectral software for the analysis of the chemical ingredients used in connection with all types of microscopes, in particular for spectroscopy testing of force and the analysis of pressure curves; Recorded software for mapping at any scale in particular land-cover mapping; Software for the analysis of the earth's relief and software for the multi-spectral or hyper-spectral analysis of geographical data; Recorded software for the reconstruction of the relief from images, in particular geographical images or from a camera or microscope; Recorded software to view or analyze on a microscopic scale; Recorded software for analyzing color; Recorded software for the analysis of use of stains or diffuse objects; Recorded software for color enhancement, in particular automatic or semi-automatic images from electronic microscopes; Recorded statistical monitoring software for the development of measurement parameters; Recorded software for monitoring the quality of a production; Recorded software for data acquisition and control, including motion, of any system enabling the acquisition of the data listed above
Conversion of computer programs and data, not physical conversion; conversion of data or documents from physical to electronic media; conversion of electronic information; quality control services for others; inspection of products for quality control purposes; digitization of sounds and images; topographic surveying; design of mechanical, electromechanical and optoelectronic apparatus and instruments; software installation; software design and development; software as a service [SaaS], featuring software for the analysis and processing of images, in particular microscopy images, the analysis of form, scale sensitive fractal, contour, texture, force curve, colocalization, free form surface, particle analysis, topography, roundness, cylindricity, roughness, waviness, thickness, distance, adhesion, distortion, atomic geometry, hyperspectral cubes, multi-spectral data, tomography including x-ray computed tomography, fourier analysis; Updating of software; maintenance of computer software; programming for computers; research and development of new products for third parties; Scientific and technological consulting services, namely, conducting of technical project studies; Scientific and technological services, namely, scientific research and development, analysis, testing, benchmarking, software integration into instruments in the field of microscopy, including scanning electron microscopy, scanning probe microscopy, hyperspectral microscopy, profilometry, form analysis, surface texture analysis, chemometry, spectroscopy, tomography including x-ray computed tomography; computer-aided industrial design, research, testing and analysis services; Provision of technical studies relating to computer programming; Conducting scientific feasibility studies; scientific research; technical research in the field of microscopy, including scanning electron, scanning probe microscopy, hyperspectral microscopy, scale sensitive fractal analysis, contour analysis, profilometry analysis, texture analysis, force curve analysis, colocalization analysis, free form surface analysis, particle analysis, image analysis, form analysis, surface texture analysis, chemometry, spectroscopy and data processing of these items, tomography, including x-ray computed tomography, fourier analysis; Computer code conversion for third parties; Testing, analysis and evaluation of the services of others to determine conformity with certification standards; Technical support services, namely, troubleshooting of computer software problems; Computer system analysis; Information technology consultancy services; Computer software consultancy; Software development in the framework of editing of software; Surveying; Engineering; Rental of computer software; Programming for computers; Computer data recovery; Off-site data backup; Electronic data storage; Monitoring of computer systems to detect breakdowns; Monitoring of computer systems for the detection of unauthorized access or data protection breaches; Data mining; Data encryption and decoding services
No 79263628
No Service Mark
No 159/450
No
No
No
No
No
No
No
No
06.01.04 -
Mountains, mountain landscapes
The mark consists of a stylized design featuring a compass in the bottom left corner, the reversed symbol for surface texture in the middle, and a sloping caliper on the right.
| Status Date | Action Taken |
|---|---|
| 08th Nov 2020 | FINAL DECISION TRANSACTION PROCESSED BY IB |
| 16th Oct 2020 | FINAL DISPOSITION NOTICE SENT TO IB |
| 05th Oct 2020 | FINAL DISPOSITION PROCESSED |
| 16th Sep 2020 | FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB |
| 16th Jun 2020 | REGISTERED-PRINCIPAL REGISTER |
| 31st Mar 2020 | PUBLISHED FOR OPPOSITION |
| 31st Mar 2020 | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED |
| 11th Mar 2020 | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED |
| 27th Feb 2020 | APPROVED FOR PUB - PRINCIPAL REGISTER |
| 27th Feb 2020 | TEAS/EMAIL CORRESPONDENCE ENTERED |
