section 8
on 13 Sep 2019
Last Applicant/ Owned by
1-24-14 Nishi-Shimbashi 1-chome
Tokyo
JP
105-8717
Serial Number
77624417 filed on 02th Dec 2008
Registration Number
4289259 registered on 12th Feb 2013
Correspondent Address
MICHELLE C. BURKE
Filing Basis
1. intent to use
2. use application currently
Disclaimer
NO DATA
Electron microscopes; scanning electron microscopes; semiconductor and integrated circuit evaluation and inspection apparatus in the nature of an electronic imaging platform for use in semiconductor manufacturing and integrated circuit manufacturing
Electron microscopes; scanning electron microscopes; semiconductor and integrated circuit evaluation and inspection apparatus in the nature of an electronic imaging platform for use in semiconductor manufacturing and integrated circuit manufacturing
30th Apr 2012
31st Oct 2012
No 77624417
No Service/Collective Mark
No 17575-796
No
No
No
No
No
No
No
No
| Status Date | Action Taken |
|---|---|
| 13th Sep 2019 | CANCELLED SEC. 8 (6-YR) |
| 12th Feb 2018 | COURTESY REMINDER - SEC. 8 (6-YR) E-MAILED |
| 12th Feb 2013 | REGISTERED-PRINCIPAL REGISTER |
| 09th Jan 2013 | NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED |
| 08th Jan 2013 | LAW OFFICE REGISTRATION REVIEW COMPLETED |
| 04th Jan 2013 | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED |
| 17th Dec 2012 | STATEMENT OF USE PROCESSING COMPLETE |
| 13th Dec 2012 | TEAS STATEMENT OF USE RECEIVED |
| 13th Dec 2012 | USE AMENDMENT FILED |
| 08th Jun 2012 | NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED |
