on 17 Oct 2014
Last Applicant/ Owned by
INDUSTRIESTRASSE 21
SINDELFINGEN
DE
D-71069
Serial Number
73228574 filed on 18th Jan 1980
Registration Number
1300222 registered on 16th Oct 1984
Correspondent Address
Edward M. Kriegsman
Filing Basis
No Filing Basis
Disclaimer
NO DATA
Scientific Measuring Instruments Used Primarily in Laboratory and Industrial Applications-Namely, Meters for Measuring the Thickness of Coatings; Specifically, Magnetic-Inductive Principle Meters, Eddy-Current Principle Meters, Beta Backscatter Principle Meters, and Capacitance Principle Meters; Porosity Test Sets for Coatings and Insulations; Meters for Measuring Electrical Conductivity of Non-FeRead More
Scientific Measuring Instruments Used Primarily in Laboratory and Industrial Applications-Namely, Meters for Measuring the Thickness of Coatings; Specifically, Magnetic-Inductive Principle Meters, Eddy-Current Principle Meters, Beta Backscatter Principle Meters, and Capacitance Principle Meters; Porosity Test Sets for Coatings and Insulations; Meters for Measuring Electrical Conductivity of Non-Ferrous Metals; Meters for Measuring the Ferrite Content of Austenitic Steel; Cutting Force Measuring Meters for Machine Tools; Sealing Testors Employing Admittance or Dissipation Factors
No 73228574
No Service/Collective Mark
No 83713
No
No
Yes
Yes
No
No
No
No
26.11.01 -
Rectangles as carriers or rectangles as single or multiple line borders
| Status Date | Action Taken |
|---|---|
| 16th Oct 2023 | COURTESY REMINDER - SEC. 8 (10-YR)/SEC. 9 E-MAILED |
| 17th Oct 2014 | REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED |
| 17th Oct 2014 | REGISTERED AND RENEWED (SECOND RENEWAL - 10 YRS) |
| 17th Oct 2014 | NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED |
| 16th Oct 2014 | TEAS SECTION 8 & 9 RECEIVED |
| 29th Jul 2009 | AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP |
| 15th May 2008 | CASE FILE IN TICRS |
| 29th Dec 2004 | REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED |
| 29th Dec 2004 | REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS) |
| 29th Oct 2004 | PAPER RECEIVED |
