on 19 Mar 2019
Last Applicant/ Owned by
1-3 ALLÉE DU NANOMÈTRE
GRENOBLE
FR
38000
Serial Number
87656237 filed on 23rd Oct 2017
Registration Number
5700474 registered on 19th Mar 2019
Correspondent Address
John Zaccaria
Filing Basis
No Filing Basis
Disclaimer
NO DATA
Information technology consulting services; Design of computer software services; Science and technology services in the nature of analysis of crystalline properties of materials and nanoscale structure of materials using small angle and/or wide angle X-ray scattering techniques; Rental of computers and computer software; Computer software design and programming services; Design and development ofRead More
Information technology consulting services; Design of computer software services; Science and technology services in the nature of analysis of crystalline properties of materials and nanoscale structure of materials using small angle and/or wide angle X-ray scattering techniques; Rental of computers and computer software; Computer software design and programming services; Design and development of computer hardware and software; Information technology (IT) consultancy, advisory and information services; Monitoring of computer systems by remote access to ensure proper functioning; Rental of computer hardware and computer facilities; Software development, programming and implementation; Advisory services relating to science, namely, preparing reports relating to scientific research; Advisory services relating to scientific instruments, namely, scientific research and development services; Research in scientific instrumentation; Research in measurement technology; Calibration of instruments; Engineering services in the field of Engineering services; Professional consultancy relating to technology, namely, technological consultation in the technology field of analysis of crystalline properties of materials and nanoscale structure of materials using small angle and/or wide angle X-ray scattering techniques; Industrial research in the field of crystalline properties of materials and nanoscale structure of materials using small angle and/or wide angle X-ray scattering techniques; Scientific laboratory testing services; Leasing of scientific instruments; Rental of measuring apparatus; Preparation of project analysis studies, namely, conducting scientific feasibility studies; Preparation of reports relating to scientific research; Preparation of technical manuals in the nature of technical writing for others; Providing science technology information in the field of science technology; Scientific research and development services; scientific research in instrumentation; Scientific research in measurement technology; Scientific research consulting in the field of analysis of crystalline properties of materials and nanoscale structure of materials using small angle and/or wide angle X-ray scattering techniques; scientific research services; Consultancy and information in relation to the aforesaid services, included in this class; All the aforesaid services in particular relating to small-angle X-ray scattering for examining material structures, in particular in combination with wide-angle X-ray scattering for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis
Arranging and conducting of symposiums in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Arranging and conducting of congresses in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Arranging and conducting conferences and seminars in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis for education and entertainment purposes; Archive library services; Computer based library services; Electronic library services; Arrangement of training courses in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Arranging and conducting of colloquiums in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Arranging and conducting of training workshops in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Computer education training; Conducting of educational courses in the field of science; Training courses in the field of science; Training courses in the field of engineering; Correspondence courses in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Postgraduate training courses in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Consultancy and providing information in relation to the aforesaid services, included in this class for educational and entertainment purpose; All the aforesaid services in particular relating to small-angle X-ray scattering for examining material structures, in particular in combination with wide-angle X-ray scattering for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis
Apparatus and instruments for conveying, distributing, transforming, storing, regulating or controlling electric current; cables for electricity; Apparatus for treatment by means of electricity, namely, electrical integrated control systems for use in the field of X-ray scattering analysis of nanomaterials and nanoscale properties of materials such as shape and size of structures; Information technology and audiovisual equipment, namely, computers and computer screens; Measuring, detecting and monitoring instruments, indicators and controllers, namely, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; Optical devices, enhancers and correctors, namely, spectrometers; Scientific research and laboratory apparatus, educational apparatus and simulators, namely, X-ray apparatus, not for medical purposes; Radiological apparatus for industrial purposes, namely, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; X-ray analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; Small angle and wide angle X-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, RNA or biological macromolecules in solution; Particle detecting apparatus, namely, X-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; X-ray detection apparatus, visible light detection apparatus, infrared detection apparatus and UV detection apparatus; Electronic sensors; Electro-optical sensors; Interfaces for detectors; Magnetic object detectors; Optical sensors; Small angle and wide angle X-ray scattering instruments for measuring nanoscale particle sizes; Photoelectric sensors; Photoionic detectors; Measuring devices, electric, namely, clamp meters for measuring electricity; Instruments for surveying physical data; Radiation-measuring instruments; optical time-domain reflectometers; Scientific apparatus, namely, spectrometers; Data processing equipment, namely, couplers, computers; Computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; X-ray producing apparatus and installations, not for medical purposes; Radiological apparatus for industrial purposes; X-ray analysers, other than for medical purposes; Scientific apparatus and instruments, in particular small-angle X-ray scattering instruments for examining material structures, in particular in combination with wide-angle X-ray scattering instruments for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; structural and replacement parts and fittings for all the aforesaid goods, included in this class
No 87656237
No Service Mark
No J1004-022
Yes
No
Yes
Yes
No
No
No
No
| Status Date | Action Taken |
|---|---|
| 19th Mar 2024 | COURTESY REMINDER - SEC. 8 (6-YR) E-MAILED |
| 19th Apr 2023 | AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP |
| 24th Jan 2020 | TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED |
| 24th Jan 2020 | ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED |
| 19th Mar 2019 | REGISTERED-PRINCIPAL REGISTER |
| 01st Jan 2019 | PUBLISHED FOR OPPOSITION |
| 01st Jan 2019 | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED |
| 12th Dec 2018 | ASSIGNED TO EXAMINER |
| 12th Dec 2018 | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED |
| 22nd Nov 2018 | EXAMINERS AMENDMENT -WRITTEN |
