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SEMILAB
Live/Registered
REGISTERED

on 28 Apr 2020

Last Applicant/ Owned by

Prielle Kornelia u. 2

Budapest

HU

H-1117

Serial Number

88632625 filed on 26th Sep 2019

Registration Number

6042056 registered on 28th Apr 2020

in the Principal Register

Correspondent Address

STEPHEN E. KELLY

HILL WARD HENDERSON, P.A.

101 E. KENNEDY BOULEVARD, SUITE 3700

TAMPA, FL 33602

Filing Basis

1. use application currently

Disclaimer

NO DATA

SEMILAB

Scientific instruments in the field of semiconductor manufacturing, namely, metrology instruments for contamination monitoring, defect inspection, contamination analysis, nano surface characterization, EPI resistivity measurement, EPI thickness measurement, compound material characterization, ion implant monitoring, thin film thickness measurement, electrical characterization of dielectrics and inRead More

Classification Information


Class [009]
Computer & Software Products & Electrical & Scientific Products


Scientific instruments in the field of semiconductor manufacturing, namely, metrology instruments for contamination monitoring, defect inspection, contamination analysis, nano surface characterization, EPI resistivity measurement, EPI thickness measurement, compound material characterization, ion implant monitoring, thin film thickness measurement, electrical characterization of dielectrics and interfaces, characterization of 3D structures, metallization control, and dielectric porosity measurement; Photovoltaic instruments for controlling the crystalline silicon solar cell manufacturing process, namely, instruments for silicon ingot and block testing, silicon wafer sorting, inline process control, offline process control, laboratory applications, and thin film applications; Scientific instruments for monitoring the production of flat panel displays, namely, instruments for monitoring the manufacturing of full-tone and half tone (photoresist), printed OLED sub-pixel characterization, IGZO electrical characterization, sheet resistance measurement, thin film characterization, ELA process characterization (LTPS), and bare glass


First Use Date in General

11th Jun 2009

First Use Date in Commerce

11th Jun 2009

Class [042]
Computer & Software Services & Scientific Services


Research and development in the field of semiconductor metrology, photovoltaic metrology, and flat panel display metrology; Custom design of metrology equipment to the specification of others


First Use Date in General

11th Jun 2009

First Use Date in Commerce

11th Jun 2009

Mark Details


Serial Number

No 88632625

Mark Type

No Service Mark

Attorney Docket Number

No 7522.010-T12

44D Filed

No

44D Current

No

44E filed

No

44E Current

No

66A Filed

No

66A Current

No

Current Basis

No

No Basis

No

Legal History


Status DateAction Taken
28th Apr 2020REGISTERED-PRINCIPAL REGISTER
11th Feb 2020OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
11th Feb 2020PUBLISHED FOR OPPOSITION
22nd Jan 2020NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
03rd Jan 2020APPROVED FOR PUB - PRINCIPAL REGISTER
30th Dec 2019ASSIGNED TO EXAMINER
02th Oct 2019NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM
30th Sep 2019NEW APPLICATION ENTERED IN TRAM