NANOSCAN Trademark Information

HERMES MICROVISION, INC.

Quality control for others of semiconductor manufacturing using particle beam

Words that describe this mark

quality   control   semiconductor   manufacturing   using   particle   beam  

This is a brand page for the NANOSCAN trademark by HERMES MICROVISION, INC.  in Hsinchu City, , 300.

Write a review about a product or service associated with this NANOSCAN trademark. Or, contact the owner HERMES MICROVISION, INC. of the NANOSCAN trademark by filing a request to communicate with the Legal Correspondent for licensing, use, and/or questions related to the NANOSCAN trademark.

Abandonment Notice! On Friday, November 2, 2018, status on the NANOSCAN trademark changed to ABANDONED - NO STATEMENT OF USE FILED. Apply Now for this name starting at $199!

CAUTION: Although federal registration for this particular filing is inactive, the mark may still enjoy common law rights, or may have been applied for again in a separate application. Further research may be warranted to determine where this mark is truly abandoned in commerce.

Status Update! On Friday, November 2, 2018, status on the NANOSCAN trademark changed to ABANDONED - NO STATEMENT OF USE FILED.

On Friday, January 16, 2015, a U.S. federal trademark registration was filed for NANOSCAN. The USPTO has given the NANOSCAN trademark serial number of 86505221. The current federal status of this trademark filing is ABANDONED - NO STATEMENT OF USE FILED. The correspondent listed for NANOSCAN is CHIN-MEI CHAO of 46 LANE 11, GUANGFU N. RD., 11TH FLOOR, TAIPEI, 105 TAIWAN . The NANOSCAN trademark is filed in the category of Computer & Software Services & Scientific Services . The description provided to the USPTO for NANOSCAN is Quality control for others of semiconductor manufacturing using particle beam.

Word mark: NANOSCAN
Status/Status Date:
ABANDONED - NO STATEMENT OF USE FILED
11/2/2018
Estimated Response Deadline: 1/2/2019
Serial Number: 86505221
Filing Date: 1/16/2015
Registration Number: NOT AVAILABLE
Registration Date: NOT AVAILABLE
Goods and Services: Quality control for others of semiconductor manufacturing using particle beam
Mark Description: NOT AVAILABLE
Type Of Mark: Service Mark
Published For Opposition Date: 7/12/2016
Last Applicant/Owner: HERMES MICROVISION, INC.
Hsinchu City 300
Mark Drawing Code: Standard Character Mark
Design Search: (NO DATA)
Register Type: Principal
Disclaimer: (NOT AVAILABLE)
Correspondent:
46 LANE 11, GUANGFU N. RD., 11TH FLOOR
TAIPEI
105
TAIWAN

Intent to Use Trademark - Applicant has not submitted proof of use in commerce the the USPTO.

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Current Trademark Status:
11/2/2018
ABANDONED - NO STATEMENT OF USE FILED
Correspondent Search:

CHIN-MEI CHAO is a correspondent of NANOSCAN trademark.

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