LASERTEC Trademark Information

Lasertec Corporation

Confocal scanning microscopes; optical inspection apparatus for industrial use for inspection of semiconductor materials, namely, photomasks and reticles silicon wafers and mask blanks in the nature of blank optical plate; phase-shift mask measurement system for photomask comprising optical measurement unit in the nature of optical measuring sensors, mask stage in the nature of optical stages for reflection and transmission measurements of fla...

This is a brand page for the LASERTEC trademark by Lasertec Corporation  in Kanagawa-ken 222-0033, , .

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On Thursday, March 03, 2016, a U.S. federal trademark registration was filed for LASERTEC by Lasertec Corporation, Kanagawa-ken 222-0033. The USPTO has given the LASERTEC trademark serial number of 79187390. The current federal status of this trademark filing is EX PARTE APPEAL PENDING. The correspondent listed for LASERTEC is GEORGE W LEWIS of WESTERMAN HATTORI DANIELS & ADRIAN LLP, 1250 CONNECTICUT AVENUE NW SUITE 700, WASHINGTON, DC 20036 . The LASERTEC trademark is filed in the category of Computer & Software Products & Electrical & Scientific Products . The description provided to the USPTO for LASERTEC is Confocal scanning microscopes; optical inspection apparatus for industrial use for inspection of semiconductor materials, namely, photomasks and reticles silicon wafers and mask blanks in the nature of blank optical plate; phase-shift mask measurement system for photomask comprising optical measurement unit in the nature of optical measuring sensors, mask stage in the nature of optical stages for reflection and transmission measurements of flat substrates; electronic controller and computer, wafer inspection system comprised of optical inspection apparatus, wafer stage in the nature of stage for semiconductor wafers, electronic controller, and computer; wafer measurement system comprised of optical measurement apparatus, wafer stage in the nature of stage for semiconductor wafers, electronic controller and computer; substrate inspection system comprised of optical inspection apparatus, substrate stage in the nature of optical stage for reflection measurement of flat substrates; electronic controller, and computer; PV cell measurement system comprised of solar simulator, measurement unit in the nature of electronic sensors for measuring solar radiation, cell stage in the nature of stage for measurement of flat substrates; electronic controller and computer; pellicle inspection and mounting system comprised of inspection head in the nature of optical inspection apparatus; pellicle mounter in the nature of Module Type Mounting System; pellicle stocker in the nature of wall mounted rack for parts; mask stage in the nature of optical stages for reflection and transmission measurements of flat substrates; electronic controller and computer; coating thickness scanning system for lithium ion batteries comprised of coating thickness measuring gauge.

Word mark: LASERTEC
Status/Status Date:
EX PARTE APPEAL PENDING
7/19/2017
Serial Number: 79187390
Filing Date: 3/3/2016
Registration Number: NOT AVAILABLE
Registration Date: NOT AVAILABLE
Goods and Services: Confocal scanning microscopes; optical inspection apparatus for industrial use for inspection of semiconductor materials, namely, photomasks and reticles silicon wafers and mask blanks in the nature of blank optical plate; phase-shift mask measurement system for photomask comprising optical measurement unit in the nature of optical measuring sensors, mask stage in the nature of optical stages for reflection and transmission measurements of flat substrates; electronic controller and computer, wafer inspection system comprised of optical inspection apparatus, wafer stage in the nature of stage for semiconductor wafers, electronic controller, and computer; wafer measurement system comprised of optical measurement apparatus, wafer stage in the nature of stage for semiconductor wafers, electronic controller and computer; substrate inspection system comprised of optical inspection apparatus, substrate stage in the nature of optical stage for reflection measurement of flat substrates; electronic controller, and computer; PV cell measurement system comprised of solar simulator, measurement unit in the nature of electronic sensors for measuring solar radiation, cell stage in the nature of stage for measurement of flat substrates; electronic controller and computer; pellicle inspection and mounting system comprised of inspection head in the nature of optical inspection apparatus; pellicle mounter in the nature of Module Type Mounting System; pellicle stocker in the nature of wall mounted rack for parts; mask stage in the nature of optical stages for reflection and transmission measurements of flat substrates; electronic controller and computer; coating thickness scanning system for lithium ion batteries comprised of coating thickness measuring gauge
Mark Description: NOT AVAILABLE
Type Of Mark: TradeMark
Published For Opposition Date: N/A
Last Applicant/Owner: Lasertec Corporation
Kanagawa-ken 222-0033
Mark Drawing Code: Drawing with Words in Stylized form
Design Search: (NO DATA)
Register Type: Principal
Disclaimer: (NOT AVAILABLE)
Correspondent:
WESTERMAN HATTORI DANIELS & ADRIAN LLP
1250 CONNECTICUT AVENUE NW SUITE 700
WASHINGTON, DC 20036

Use in Commerce Trademark - Applicant has provided proof of use of this mark in commerce to USPTO.

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Current Trademark Status:
7/19/2017
EX PARTE APPEAL PENDING
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GEORGE W LEWIS is a correspondent of LASERTEC trademark.

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