XSIDE Trademark Information

KLA-Tencor Corporation

Die sorter inspection and metrology testing equipment comprised of optical and infrared inspectors and lasers for use in the manufacturing, testing and inspection of wafers, semiconductors, and integrated circuits; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers

This is a brand page for the XSIDE trademark by KLA-Tencor Corporation  in Milpitas, CA, 95035.

Write a review about a product or service associated with this XSIDE trademark. Or, contact the owner KLA-Tencor Corporation of the XSIDE trademark by filing a request to communicate with the Legal Correspondent for licensing, use, and/or questions related to the XSIDE trademark.

On Thursday, June 16, 2016, a U.S. federal trademark registration was filed for XSIDE by KLA-Tencor Corporation, Milpitas, CA 95035. The USPTO has given the XSIDE trademark serial number of 87074433. The current federal status of this trademark filing is NON-FINAL OFFICE ACTION ISSUED - CLARIFICATION NEEDED. The correspondent listed for XSIDE is HAROLD MILSTEIN of SHEPPARD MULLIN RICHTER & HAMPTON LLP, 379 LYTTON AVENUE, PALO ALTO, CA 94301 . The XSIDE trademark is filed in the category of Computer & Software Products & Electrical & Scientific Products . The description provided to the USPTO for XSIDE is Die sorter inspection and metrology testing equipment comprised of optical and infrared inspectors and lasers for use in the manufacturing, testing and inspection of wafers, semiconductors, and integrated circuits; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers.

Word mark: XSIDE
Status/Status Date:
NON-FINAL OFFICE ACTION ISSUED - CLARIFICATION NEEDED
10/10/2016
Estimated Response Deadline: 4/10/2017
Serial Number: 87074433
Filing Date: 6/16/2016
Foreign Filing Deadline: Friday, December 16, 2016
 
Registration Number: NOT AVAILABLE
Registration Date: NOT AVAILABLE
Goods and Services: Die sorter inspection and metrology testing equipment comprised of optical and infrared inspectors and lasers for use in the manufacturing, testing and inspection of wafers, semiconductors, and integrated circuits; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers
Mark Description: NOT AVAILABLE
Type Of Mark: TradeMark
Published For Opposition Date: N/A
Last Applicant/Owner: KLA-Tencor Corporation
Milpitas, CA 95035
Mark Drawing Code: Standard Character Mark
Design Search: (NO DATA)
Register Type: Principal
Disclaimer: (NOT AVAILABLE)
Correspondent:
SHEPPARD MULLIN RICHTER & HAMPTON LLP
379 LYTTON AVENUE
PALO ALTO, CA 94301

Intent to Use Trademark - Applicant has not submitted proof of use in commerce the the USPTO.

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What our customers say:

testimonial

I wasn't too sure what to expect when taking up services, but the professionalism from the site to the customer service is the slickest I have ever experienced.

Camryn, Surrey, UK
Current Trademark Status:
10/10/2016
NON-FINAL OFFICE ACTION ISSUED - CLARIFICATION NEEDED
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HAROLD MILSTEIN is a correspondent of XSIDE trademark.

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