TPAC EXPLORER

Class [009]
Computer & Software Products & Electrical & Scientific Products

High performance compact ultrasonic hardware with specialized features for non-destructive testing applications to be used in automated or manual inspection systems, scanners, or robots for scientific and industrial uses; ultrasonic hardware and recorded software system for phased array and TFM (Total Focusing Method) inspections for scientific and industrial uses sold as a unit for the detection of defects, measuring and maintenance; electronic enclosures, namely, aluminum enclosure boxes and cases, probes in the nature of ultrasound probe not for medical use and sensors in the nature of sensor chips for scientific use and of ultrasonic sensors for non-destructive testing applications; instruments for conducting, switching, transforming, accumulating apparatus, regulating or controlling the distribution or use of electricity, namely, electronic sensors for scientific and industrial uses for the detection of defects, measuring and maintenance, electronic sensor chips for scientific and industrial uses, electrical conductors and cables, electrical switches, electric transformers, electrical connectors for power supply transducers that utilize ultrasonic signals to test stress and fatigue in metallic and non-metallic structures, electric batteries for powering non-destructive testing equipment; apparatus for recording, transmission or reproduction of sound or images in the nature of ultrasonic transmission machines; downloadable software for data processing and for non-destructive testing inspections and signal image processing; components, sub-systems and equipment for non-destructive testing systems and instruments, namely, air-coupled ultrasounds, phased array ultrasounds, monoprobes, multi-probes, phase network probes, and eddy current probes, capacitors, storage filers, standard probe connectors, oscillators, electric relays, electric switches, transformers, electric resistors, semiconductors, integrated circuits and field-programmable gate arrays, all for use in the detection of defects, measuring and maintenace; all of the foregoing being used in the field of non-destructive testing application