2DPWA Trademark Information

Kabushiki Kaisha Hitachi High-Technologies

Image analysis software for CD-SEMs (Scanning Electron Microscope); computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage and management software

This is a brand page for the 2DPWA trademark by Kabushiki Kaisha Hitachi High-Technologies  in Tokyo, , .

Write a review about a product or service associated with this 2DPWA trademark. Or, contact the owner Kabushiki Kaisha Hitachi High-Technologies of the 2DPWA trademark by filing a request to communicate with the Legal Correspondent for licensing, use, and/or questions related to the 2DPWA trademark.

Status Update! On Saturday, December 3, 2016, status on the 2DPWA trademark changed to NON-FINAL OFFICE ACTION ISSUED - CLARIFICATION NEEDED.

On Thursday, March 17, 2016, a U.S. federal trademark registration was filed for 2DPWA by Kabushiki Kaisha Hitachi High-Technologies, Tokyo. The USPTO has given the 2DPWA trademark serial number of 86944457. The current federal status of this trademark filing is NON-FINAL OFFICE ACTION ISSUED - CLARIFICATION NEEDED. The correspondent listed for 2DPWA is JILL ANDERFUREN of LEWIS BRISBOIS BISGAARD & SMITH LLP, 550 WEST ADAMS STREET, SUITE 300 CHICAGO, IL 60661 . The 2DPWA trademark is filed in the category of Computer & Software Products & Electrical & Scientific Products . The description provided to the USPTO for 2DPWA is Image analysis software for CD-SEMs (Scanning Electron Microscope); computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage and management software.

Word mark: 2DPWA
Status/Status Date:
NON-FINAL OFFICE ACTION ISSUED - CLARIFICATION NEEDED
12/3/2016
Estimated Response Deadline: 6/3/2017
Serial Number: 86944457
Filing Date: 3/17/2016
Registration Number: NOT AVAILABLE
Registration Date: NOT AVAILABLE
Goods and Services: Image analysis software for CD-SEMs (Scanning Electron Microscope); computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage and management software
Mark Description: NOT AVAILABLE
Type Of Mark: TradeMark
Published For Opposition Date: N/A
Last Applicant/Owner: Kabushiki Kaisha Hitachi High-Technologies
Tokyo
Mark Drawing Code: Standard Character Mark
Design Search: (NO DATA)
Register Type: Principal
Disclaimer: (NOT AVAILABLE)
Correspondent:
LEWIS BRISBOIS BISGAARD & SMITH LLP
550 WEST ADAMS STREET
SUITE 300
CHICAGO, IL 60661

Use in Commerce Trademark - Applicant has provided proof of use of this mark in commerce to USPTO.

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Current Trademark Status:
12/3/2016
NON-FINAL OFFICE ACTION ISSUED - CLARIFICATION NEEDED
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JILL ANDERFUREN is a correspondent of 2DPWA trademark.

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